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Antenna Measurement, NSI-MI Technologies, RF/Microwave

Medium Horizontal Planar Scanner Systems

Manufacturer: NSI-MI Technologies
Product Number: PNF-XYH-40×22

Product Description

Medium Horizontal Planar Scanner Systems are an ideal systems for measuring large aperture antennas with medium to high gain (>15 dBi) making them suitable for testing larger arrays or reflector antennas that require a zenith orientation for testing. Medium Horizontal Planar Scanner Systems are based on an “H” frame design and are constructed using two reinforced steel X rails that support a stiff yet light weight Y-bridge on precision bearing rails. The high capacity probe stage can accommodate various probes from L to mmWave bands including any necessary RF equipment, probe extensions and optional roll and Z stages.

Key Specification

  • High Accuracy
  • 22’x 22′ (6.7 m x 6.7 m) to 40’x 30′ (12.1 m x 9.1 m) Scan Area
  • Precision Rack and Pinion Drive
  • L-Band to mmWave Measurements
  • Far-Field, Near-Field and Holographic Patterns
  • Space Based Applications

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