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Antenna Measurement, NSI-MI Technologies, RF/Microwave

Small Horizontal Planar Scanner Systems

Manufacturer: NSI-MI Technologies
Product Number: PNF-XYH-6×6

Product Description

Small Horizontal Planar Scanner Systems are the ideal systems for measuring large aperture antennas with medium to high gain (>15 dBi) making them suitable for testing larger arrays or reflector antennas that require a zenith orientation for testing. The Horizontal Planar Scanners are based on an “H” frame design and are constructed using two reinforced steel X rails that support a stiff yet light weight Y-bridge on precision bearing rails. The high capacity probe stage can accommodate various probes from L to mmWave bands including any necessary RF equipment, probe extensions and optional roll and Z stages.

Key Specification

  • High Accuracy
  • 6’x 6′ (1.8 m x 1.8 m) to 15’x 15′ (4.5 m x 4.5 m) Scan Area
  • Precision Rack and Pinion Drive
  • L-Band to mmWave Measurements
  • Inverted “T” Frame Design for High Accuracy
  • Far-Field, Near-Field and Holographic Patterns
  • Space and Radar Applications

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