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Antenna Measurement, NSI-MI Technologies, RF/Microwave

Medium Vertical Planar Scanner Systems

Manufacturer: NSI-MI Technologies
Product Number: PNF-XYV-30×30

Product Description

The Medium Vertical Planar Near-Field Measurement System are the ideal system for measuring medium and high gain antennas (>15 dBi) with large sized apertures making it suitable for testing large arrays or reflector antennas. They are based on an inverted “T” design and are constructed of steel. For high stability a welded cross-braced dual-rail base is used. This robust design is easy to maintain and align, and highly accurate. The high capacity probe carriage accommodates probes as low as L-band including optional roll and Z stages.

Key Specification

  • High Accuracy Planarity
  • 18’x 18′ (5.4 m x 5.4 m) to 30’x 30′ (9.1 m x 9.1 m) Scan Area
  • Precision Rack and Pinion Drive
  • L-Band to mmWave Measurements
  • Inverted “T” Frame Design for High Accuracy
  • Far-Field, Near-Field and Holographic Patterns
  • Cylindrical and Spherical Options Available


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